Institute of Physical and Theoretical Chemistry

Scanning probe microscopy

  • Scanning probe microscope based on shear-force feedback

    • Mechanically excited tuning fork shear-force movements
    • Tip – sample distance control via monitoring phase change during tip approaching
    • Conducting and non-conducting surface

  • Scanning probe microscope based on tunneling current

    • Tip – sample distance control via monitoring of tunneling current
    • Bias voltage can be applied
    • Conducting surface