Tip-enhanced scanning near-field optical microscopes (T-SNOM) has the ability to correlate local spectroscopic information with topography at the nanometer scale (a). Collecting correlated signals of Raman (b) and photoluminescence (c) as well as topography (d), tip-enhanced hyperspectral imaging is able to provide a thorough map of the chemical and morphology-related optical properties in multi-component material systems consisting of: - molecular films
- quantum dots
- plasmonic structures
- (in)organic semiconductors
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Parabolic Mirror Microscope
Theory of Tip-Enhanced Near-Field Optical Microscopy
