Scanning Electron Microscope
- HITACHI SU8030
- Lower/Upper/Top (Triple) electron detectors
- Large chamber/large stage model
- Bruker EDX detector:
-
Bruker QUANTAX 6G
Typ 200
XFlash 6/60-250
SDD slew 60 126eV Resolution at Mn-Ka and 1cps
-
- STEM capability
- Cold field emission with ultra low voltage imaging resolution of 1.3nm at 1.0kV (Hitachi)
- The system is now managed by the group of AK Scheele. Forms and instructions can be found here.