Our lab equipment

Photoelectron Spectroscopy (PES)

• Small spot XPS with FOCUS 500 x-ray monochromator (SPECS), UV source and Phoibos 150 MCD analyzer (SPECS) and LEED.
• Further XPS spectrometers with hemispherical analyzers, standard x-ray sources, LEED for specific applications.
• Kelvin Probe and other complementary techniques.

Photoelectron Diffraction (XPD, LEED)

• Angle resolved XPS spectrometer with Phoibos 100 MCD analyzer (SPECS), suitable for large samples. Both the polar and the azimuthal angle are automatically controlled during the measurement.

Raman Microscopy & Spectroscopy (Raman)

• Confocal Raman-Microscope (HORIBA-JY, HR 800) with a confocality of about 2 microns

Infrared Microscopy & Spectroscopy (FT-IR)

• Bruker FT IR VERTEX 70v (vacuum) with MIRacle ATR-unit (1 reflection) and HYPERION 2000 infrared microscope.

Scanning Electron Microscopy (SEM)

• HITACHI SU8030 scanning electron microscope with Bruker-EDX (energy dispersive x-ray spectroscopy).

Atomic Force Microscopy (AFM)

• Nanoscope III (Digital Instruments)

Simulation

• Theory vs. Experiment (For example, XPD and XAS simulations using standard programme packages)

LISA+ Equipment

Member of the Lisa+ Network offering a large variety of facilites. The folloing LISA+ devices are managed by our group:

Scanning Tunneling Microscopy (STM)

• Omicron variable temperature scanning tunneling microscope (VT-STM).

Scanning Auger Microscopy (AES, SAM)

• Phi 600 Scanning Auger Micrscope