Services

The TSM offers services of various kinds, starting with a general user consulting on the possibilities of electron microscopy for their specific research questions, support in the selection of the appropriate equipment and sample preparation methods, up to support in the analysis and evaluation of image data and planning of analysis pipelines.

Please contact Dr. Stefan Fischer to discuss your specific project / user case request.

List of offered services:

TEM

• Negative contrasting and sample analysis at the TEM
• High pressure freezing, freeze substitution, embedding in epon or methacrylates, ultramicrotomy, contrasting with heavy metals, optionally with immunofluorescence or immunogold labelling and analysis at the TEM
• Chemical fixation, dehydration via solvent, embedding in epon or methacrylates, ultramicrotomy, contrasting with heavy metals, optionally with immunofluorescence or immunogold labelling and analysis at the TEM
• Microwave-assisted preparation: chemical fixation, dehydration with solvents, embedding in epon or methacrylates, ultramicrotomy, contrasting with heavy metals, optionally with immunofluorescence or immunogold labelling and subsequent analysis at the TEM
• Tokuyasu and cryo-ultramicrotomy, followed by immunofluorescence or immunogold labelling and analysis at the TEM and epifluorescence microscope

SEM / FIB-SEM

• Freeze-drying, sputter coating and SEM examination
• Chemical sample fixation, dehydration, critical point drying or by HMDS, sputter coating and examination at SEM / FIB-SEM
• Chemical fixation or fixation by high pressure freezing and freeze substitution and sample embedding in epoxy resin, for examination via FIB-Milling
• Analysis of serial sections (ultramicrotomy) on silicone wafers via SEM (array tomography)
• Analysis by energy dispersive X-ray spectroscopy (EDX)

Cryo-SEM / Cryo-FIB

• Plunge freezing, sputter coating and examination under cryogenic conditions in the SEM (Zeiss EVO10) 
• High pressure freezing, optional with freeze fracture, sputter coating and sample analysis at the Cryo-FIB-SEM (optional incl. volume imaging)