Tübingen Structural Microscopy (TSM)

Electron microscopes

 

The TSM core facility coordinates access to a number of different electron microscopes (FIB, SEM, TEM, Electron probe microanalyzer) and as well as corresponding auxiliary devices.

 

Focussed Ion Beam (FIB)

Zeiss Crossbeam 550L

Zeiss Crossbeam 550L (Cryo-FIB-SEM)

  • equipped with a field emission gun and two air lock systems for sample exchange for room temperature and cryo samples
  • multiple detectors (Inlens SE, SESI, ESB, BSE, STEM), UniGIS System (C, PT), XEI Evactron Zephyr Plasma Cleaner, EDS/EDX detector (UltimMax 100 /   AZtecEnergy Advanced)
  • Kleindiek Micromanipulator for lamella lift out
  • Software packages: SmartSEM, SmartFIB,Atlas, Atas 3D

Location: GUZ, Level 2, room E2P02

Contact: Dr. Stefan Fischer 07071 29 78929    email

 

Scanning electron microscopes (SEM)

LEO Modell 1450 VP

LEO Modell 1450 VP

 

- Tungsten cathode
- equipped with 4-quadrant BSE detector
- EDX-System: INCA Energy 300 (Oxford) (Not applicable at the moment)
- Cathodoluminescence Model ASK SEM-CL View VIS

 

Location: GUZ (E2 Room 2L02)

contact: Hartmut Schulz  07071 29 72496  email

Zeiss EVO LS 10

Zeiss EVO LS 10

 

- 1-15kV Scanning Electron microscope

 

- LaB6 cathode

- Backscatter detector

- Emitech K1250X Cryo preparation unit

Location: E-Bau (Auf der Morgenstelle 28), level 2, room E2H11

Contact: Monika Meinert 07071 29 76961 email

Thermo Fisher Phenom XL

Thermo Fisher Phenom XL

 

​​​​​​- Tabletop Electron Microscope

 

- CeB6 electron gun

- 5 kV/20 kV observation condition

- energy dispersive spectrometer eqipped with SDD

- SE and BSE (COMPO, TOPO mode) detector

Location: GUZ, level 5, room 5B41

Contact: PD Dr. Benjamin F. Walter, 2973485, email

 

 

HITACHI TM3030Plus

HITACHI TM3030Plus

 

- Tabletop Electron Microscope

 

- T electron gun

- 5 kV/15 kV observation condition

- energy dispersive spectrometer eqipped with SDD

- SE and BSE (COMPO, TOPO mode) detector

Location: GUZ, level 5, room 5B41

Contact: PD Dr. Benjamin F. Walter, 2973485, email

Transmission electron microscopes (TEM)

Tecnai 10

FEI Tecnai 10

 

- 80 -100kV acceleration voltage,  LaB6 cathode

 

- equipped with a Gatan RIO 9 digital camera (3K, side-mount)

- digital compustage and Imagingsoftware allows for large scale stitching of image tiles.

Location: E-Bau (Auf der Morgenstelle 28), Level 2, room E2H08

Contact: Julia Straube  07071 29 77587  email    ; Prof. Dr. Oliver Betz 07071 29 72995  email

Jeol JEM TEM 1400plus

 

- 120 kV accelerating voltage

 

- Tietz TemCam F-416 CMOS camera (4K)

- Goniometer

- CLEM Software

Location:   ZMBP (Auf der Morgenstelle 32), level 3, room 3W04

Contact: Dr. Sandra Richter   07071 29 76662  email

Electron Probe Microanalyzer (EPMA)

JEOL JXA-8239

JEOL JXA-8239

 

- W or LaB6 electron gun

 

- five wavelength-dispersive spectrometers (WDS), detectable element range Be - U

- energy dispersive spectrometer eqipped with SDD

- secondary electron (SE), backscattered electron (BE: COMPO, TOPO mode) and cathode-luminescence (CL) detector

Location: GUZ, level 2, room 2M02

Contact: PD Dr. Benjamin F. Walter, 2973485, email

Contact

Dr. Stefan Fischer (Head of TSM Core Facility)

email

+49 7071 29-78929